MTE3547 Materials characterisation and modelling

When you finish this unit, you should be able to:

1. 1

   Understand the interaction of ionising radiation with materials and the resultant secondary effects; derive the structure factor and extinction law in diffraction events.

2. 2

   Account for the optics in electron microscopy and types of lens defects and the limit of resolution and sensitivity.

3. 3

   Understand the scattering of x-rays and electrons in materials, and the types of information that can be generated.

4. 4

   Interpret results generated by characterisation instruments including XRD, SEM and TEM.

5. 5

   Recognise the capabilities of instruments can be expanded by the introduction of spectrometers to collect secondary signals, the addition multiple detectors to collect different types of scattering and possibilities cutting edge instruments such as synchrotrons and aberration corrected TEMs.

6. 6

   Identify significant interactions among variables in an experiment, and design an experiment to extract those interactions.

7. 7

   Use a difference equation to model simple dynamical systems.

8. 8

   Propose and analyse an appropriate model for given scenarios.

9. 9

   Construct a simple simulation using a probabilistic model.